Excellence Initiative - Research University
Contactul. Gagarina 7, 87-100 Toruń
tel.: +48 56 611-43-02
fax: +48 56 611-45-26
e-mail: wydzial@chem.umk.pl
zdjęcie nagłówkowe

Atomic force microscopy (AFM)

Laboratory has at its disposal a microscope with SPM scanning probe manufactured by Veeco (Digital Instrument USA). The system includes: MultiMode microscope with NanoScope IIIa  and Quadrex controller, E-type scanner with  maximum scanning area ​​10x10x2.5 µm.

The set works as AFM atomic force microscope and STM scanning tunnel microscope with atomic resolution.

Available work techniques:

  • STM scanning tunneling microscope,
  • Contact Mode, atomic force microscope in contact mode,
  • Tapping Mode, atomic force microscope in intermittent contact mode,
  • TRmode, atomic force microscope measuring lateral forces,
  • EFM, atomic force microscope for measuring electric potential,
  • FM, atomic force microscope with force modulation.

Additional equipment:

  • handle for work in liquids,
  • environmental shield cylinder
  • kit for measuring nano-scratches and nano-dents.

Fees for the analysis are negotiated and depend on the sample feature, number of enlargements,  special preparation of the sample for analysis, etc.

For further information please contact:

M.Sc. Mariola Krawitowska
phone: (56) 611-48-32
e-mail: m.krawitowska@umk.pl